## Treatise on Materials Science and Technology, Volume 2; Volume 19, Part 1 |

### From inside the book

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Page 8

then m ' ( 5b ) de , = o [ ( 1 + v ) / E ] Because several

then m ' ( 5b ) de , = o [ ( 1 + v ) / E ] Because several

**values**of dolls are determined , errors resulting from random fluctuations are minimized . Four to six vs tilts , taken in equal increments of sin ? y , are normally employed .Page 13

The analysis is based on strains ( € ) and primes imply

The analysis is based on strains ( € ) and primes imply

**values**in laboratory coordinates , whereas unprimed quantities refer to the specimen axes . For example , 633 is the strain normal to the diffracting planes den - de € 33 ( 6,4 ) ...Page 85

The endpoints are 8 functions with appropriate integral

The endpoints are 8 functions with appropriate integral

**values**. The solid curve neglects sample ... A single g**value**has been assumed for both sides of the original specimen interface . If g were to take on different**values**on each ...### What people are saying - Write a review

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### Contents

The Investigation of Composition | 63 |

Penetration Distance | 75 |

Choice of Binary System for Composition | 86 |

Copyright | |

11 other sections not shown

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### Common terms and phrases

absorption addition allow alloy angle Appl applications atoms band bandgap beam broadening coefficients components composition concentration containing cooling cross section curve defects dependent deposits depth determined developed diffraction diffusion direction discussed dislocation distribution donor effect electron elements emission energy et al example excitation experimental factor field function give given heat hyperfine important impurities increasing intensity interaction iron laser lattice layer less magnetic material measurements Metals method Monemar Mössbauer neighbor observed obtained occur optical parameter peak phase Phys position possible powders problem produce properties range rays recently recombination region relative residual stress ribbon sample semiconductors shift shown solid spacing specimen spectra spectrum sputtering steel stress structure studies substrate surface target techniques temperature term thickness values variation volume X-ray